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表面分析研究会 | 論文
- Electron Beam Effects on AES Depth Profiling of SiO2 Thin Film on Si(001): a Factor Analysis Study (Special Issue on Quantitative Surface Chemical Analysis in honor of Kazuhiro Yoshihara)
- Effects of electron backscattering in Auger electron spectroscopy: recent developments (Special issue on Auger electron spectroscopy in honor of Professor Keisuke Goto)
- NIST Databases for Surface Analysis by Auger-Electron Spectroscopy and X-Ray Photoelectron Spectroscopy
- Study of implanted B[+] and P[+] ions into Si(100) for ultra shallow junction by SIMS (Proceedings of PSA-07 (International Symposium on Practical Surface Analysis) November 25-28, 2007, Kanazawa, Japan)
- Restoration of Loss Function in Very Diffilcult Case-From Poor Resolution Spectrum
- Effect of Annealing on the Bonding Structure and Dielectric Properties of a-C: F Thin Films
- Atomic Scale Interface Analysis with MEIS for Nano-Electronics Technology
- Standardization of SIMS Shallow Junction Profiling with Multiple Delta-Layer Thin Films
- Reference Materials for SIMS Depth Profiling Analysis
- SIMS Deconvolution of Delta Layers in Silicon
- Auger crater edge profiling by water droplet impact (Special issue on Auger electron spectroscopy in honor of Professor Keisuke Goto)
- Direct and real-time surface analysis and imaging of biological samples by probe electrospray (Extended abstracts book of the International Workshop for Surface Analysis and Standardization '09 (iSAS-09))
- Accuracy of Carbide Analysis Using Auger Electron Spectroscopy
- Synchrotron radiation photoemission spectroscopy for native oxide layer on Vanadium and VCrTa (Extended abstracts book of the International Workshop for Surface Analysis and Standardization '09 (iSAS-09))
- Evaluation of Proteins Immobilized on Glass Substrates of Biosensor with TOF-SIMS
- Practical Aspect of Charging Phenomena in XPS as Demonstrated in Oxidized-Al Films on Al and Al Alloys
- Invited paper: Surface characterization of nanoparticles: critical needs and significant challenges (Proceedings of the 5th international symposium on practical surface analysis, PSA-10 and 7th Korea-Japan international symposium on surface analysis)
- Challenges in Applying Surface Analysis Methods to Nanoparticles and Nanostructured Materials
- 多項式によるXPSピーク位置の最適決定法2〔含 査読者との質疑〕
- 低速イオン銃を用いた高分解能深さ方向分析〔含 査読者からのコメント・質疑応答〕