Degradation Phenomenon of p〔+〕 to p〔+〕 Isolation Characteristics Caused by Carrier Injection in a High-Voltage Process

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概要

• 論文の詳細を見る
• Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文

著者

• Kim S‐h

  Kyungpook National Univ. Taegu Kor

関連論文

• Degradation Phenomenon of p〔+〕 to p〔+〕 Isolation Characteristics Caused by Carrier Injection in a High-Voltage Process

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