Crystallographic Orientations and Electrical Properties of Bi_<3.47>La_<0.85>Ti_3O_<12> Thin Film on Pt/Ti/SiO_2/Si and Pt/SiO_2/Si Substrates
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概要
- 論文の詳細を見る
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2003-04-15
著者
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Kim J.
Basic Research Laboratory Electronics And Telecommunications Research Institute (etri)
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You I.
Basic Research Laboratory Electronics And Telecommunications Research Institute (etri)
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RYU S.
Basic Research Laboratory, Electronics and Telecommunications Research Institute (ETRI)
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LEE W.
Research Center for Electronic Ceramics (RCEC), Department of Advanced Materials Engineering, Dong-E
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LEE N.
Basic Research Laboratory, Electronics and Telecommunications Research Institute (ETRI)
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SHIN W.
Basic Research Laboratory, Electronics and Telecommunications Research Institute (ETRI)
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CHO S.
Basic Research Laboratory, Electronics and Telecommunications Research Institute (ETRI)
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YOON S.
Basic Research Laboratory, Electronics and Telecommunications Research Institute (ETRI)
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YU B.
Basic Research Laboratory, Electronics and Telecommunications Research Institute (ETRI)
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KOO J.
Basic Research Laboratory, Electronics and Telecommunications Research Institute (ETRI)
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Lee W.
Research Center For Electronic Ceramics (rcec) Department Of Advanced Materials Engineering Dong-eui
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Koo J.
Basic Research Laboratory Electronics And Telecommunications Research Institute (etri)
関連論文
- Crystallographic Orientations and Electrical Properties of Bi_La_Ti_3O_ Thin Film on Pt/Ti/SiO_2/Si and Pt/SiO_2/Si Substrates
- Crystallographic Orientations and Electrical Properties of Bi3.47La0.85Ti3O12 Thin Films on Pt/Ti/SiO2/Si and Pt/SiO2/Si Substrates