3D profile measurement by colored pattern projection (1^<st> report) - system calibration

スポンサーリンク

概要

• 論文の詳細を見る
• 2002-10-01

著者

• Chanin Sinlapeecheewa

  The University Of Tokyo

• TAKAMASU Kiyoshi

  The University of Tokyo

関連論文

• Reliability of parameters of associated base straight line in step height samples : Uncertainty evaluation in step height measurements using nanometrological AFM
• 3D profile measurement by colored pattern projection (1^ report) - system calibration

スポンサーリンク