Development of a frequency-domain method using completely optical techniques for measuring the interfacial thermal resistance between the metal film and the substrate
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概要
- 論文の詳細を見る
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
著者
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Xu Yibin
Graduate School Of Human Informatics Nagoya University
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Xu Yibin
Materials Information Technology Station National Institute For Materials Science
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