Scanning tunneling microscope study of surface morphology variation of CeO2(111) with changing annealing condition (Special issue: Scanning probe microscopy)
スポンサーリンク
概要
著者
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Sainoo Yasuyuki
Institute Of Multidisciplinary Research For Advanced Materials (imram) Tohoku University
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Komeda Tadahiro
Institute Of Multidisciplinary Research For Advanced Materials (imram) Tohoku University
関連論文
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- Electronic Structure of the Si(100) Surface A Defects Analyzed by Scanning Tunneling Spectroscopy at 80 K
- Spontaneous Fluctuation between Symmetric and Buckled Dimer Domains of Si(100) at 80 K
- Scanning tunneling microscope study of surface morphology variation of CeO2(111) with changing annealing condition (Special issue: Scanning probe microscopy)
- Direct Observation of Molecular Orbital at Carbon Nanotube End
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- Erratum: "Direct Observation of Molecular Orbital at Carbon Nanotube End"