Analysis and compensation for artifacts in three-dimensional refractive index profiling by four-wave mixing microscopy

スポンサーリンク

概要

• 論文の詳細を見る
• Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文

著者

• Itoh Kazuyoshi

  Department Of Material And Life Science Graduate School Of Engineering Osaka University

関連論文

• Multi-Spectral Two-Photon Excited Fluorescence Microscopy Using Supercontinuum Light Source
• Lateral Polarity Control in GaN Based on Selective Growth Procedure Using Carbon Mask Layers
• Analysis and compensation for artifacts in three-dimensional refractive index profiling by four-wave mixing microscopy
• Depth-Resolved Observation of Photoelastic Effect by Four-Wave Mixing Microscopy
• Three-Dimensional Profiling of Refractive Index Distribution inside Transparent Materials by Use of Nonresonant Four-Wave Mixing Microscopy

スポンサーリンク