Deep-trap stress induced leakage current model for nominal and weak oxides

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概要

• 論文の詳細を見る
• Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文

著者

• Okumura Tsugunori

  Tokyo Metropolitan Univ. Tokyo Jpn

関連論文

• Deep-trap stress induced leakage current model for nominal and weak oxides
• Monolithic Gyrators Using Resonant Tunneling Diodes and Application to Active Inductors

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