Reliability Testing for The Next Generation of ULSI with SOI MOSFET's

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概要

• 論文の詳細を見る
• 大阪大学極限科学研究センタ-の論文

著者

• TAKAOKA H.

  Research Center for Materials Science at Extreme Conditions, Osaka University

• Takaoka H.

  Research Center For Materials Science At Extreme Conditions Osaka University

• Takai M.

  Research Center For Materials Science At Extreme Conditions Osaka University

関連論文

• A Twin Optically-Pumped Far-Infrared CH_3OH Laser for Plasma Diagnostics
• Pressure Induced Superconductivity in Some Simple Systems
• Direct Measurement of Transient Drain Current in PD-SOI MOSFETs Using Nuclear Microprobe for Highly Reliable Device Design
• Direct Observation of Floating Body Effect in SOI MOS FET using Nuclear Microprobe
• Reliability Testing for The Next Generation of ULSI with SOI MOSFET's

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