Ge homoepitaxial growth by metal–organic chemical vapor deposition using t-C
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概要
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We succeeded in growing Ge homoepitaxial films by metal–organic chemical vapor deposition (MOCVD) using tertiarybutylgermane (t-C<inf>4</inf>H<inf>9</inf>GeH<inf>3</inf>). We synthesized and investigated the characteristics of t-C<inf>4</inf>H<inf>9</inf>GeH<inf>3</inf>. The vapor pressure was sufficiently high in the CVD process. The precursor was sufficiently safe as it did not have a pyrophoric and explosive nature. The Ge homoepitaxial growth was achieved at 360 °C under reduced pressure on an appropriately cleaned Ge(001) substrate.
- Institute of Physicsの論文
- 2014-10-02