Low-power scan driver embedded with level shifter using depletion-mode amorphous indium–gallium–zinc–oxide thin-film transistors for high-resolution flat-panel displays
スポンサーリンク
概要
- 論文の詳細を見る
- Institute of Physicsの論文
- 2014-01-31
著者
-
Lee Chang-hee
Department Of Electrical Engineering & Computer Science Korea Advanced Institute Of Science And
-
Lee Chang-Hee
Department of Electronic Engineering, Hanyang University, Seoul 133-791, Korea.
関連論文
- Residual Stress Effect on Self-Annealing of Electroplated Copper
- Parametric Amplification in a Directly Modulated Semiconductor Laser : Optics and Quantum Electronics
- Prediction of macrozoobenthic species distribution in the Korean Saemangeum tidal flat based on a logistic regression model of environmental parameters
- Residual Stress Effect on Self-Annealing of Electroplated Copper
- Low-power scan driver embedded with level shifter using depletion-mode amorphous indium–gallium–zinc–oxide thin-film transistors for high-resolution flat-panel displays