Erratum: ``Mitigation of Complementary Metal--Oxide--Semiconductor Variability with Metal Gate Metal--Oxide--Semiconductor Field-Effect Transistors''
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概要
- 論文の詳細を見る
- 2011-11-25
著者
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Jammy Raj
Front-End Process Division, SEMATECH, 2706 Montopolis Drive, Austin, TX 78741, U.S.A.
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Majhi Prashant
Front-End Process Division, SEMATECH, 2706 Montopolis Drive, Austin, TX 78741, U.S.A.
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Smith Casey
Front-End Process Division, SEMATECH, 2706 Montopolis Drive, Austin, TX 78741, U.S.A.
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Yang Ji-Woon
Department of Electronics and Information Engineering, Korea University, 208 Seochang, Jochiwon, Yeonki, Chungnam 339-700, Korea
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Park Chang
Front-End Process Division, SEMATECH, 2706 Montopolis Drive, Austin, TX 78741, U.S.A.
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Adhikari Hemant
Front-End Process Division, SEMATECH, 2706 Montopolis Drive, Austin, TX 78741, U.S.A.
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Huang Jeff
Front-End Process Division, SEMATECH, 2706 Montopolis Drive, Austin, TX 78741, U.S.A.
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Heh Dawei
Front-End Process Division, SEMATECH, 2706 Montopolis Drive, Austin, TX 78741, U.S.A.
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Yang Ji-Woon
Department of Electronics and Information Engineering, Korea University, Yeonki, Chungnam 339-700, Republic of Korea
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Heh Dawei
Front-End Process Division, SEMATECH, 706 Montopolis Drive, Austin, TX 78741, U.S.A.
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Smith Casey
Front-End Process Division, SEMATECH, 706 Montopolis Drive, Austin, TX 78741, U.S.A.
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Park Chang
Front-End Process Division, SEMATECH, 706 Montopolis Drive, Austin, TX 78741, U.S.A.
関連論文
- Mitigation of Complementary Metal–Oxide–Semiconductor Variability with Metal Gate Metal–Oxide–Semiconductor Field-Effect Transistors
- Erratum: ``Mitigation of Complementary Metal--Oxide--Semiconductor Variability with Metal Gate Metal--Oxide--Semiconductor Field-Effect Transistors''