Wavelength-Scanning Method for Identifying Vertical Position of Film Using Surface Plasmon Microscopes
スポンサーリンク
概要
- 論文の詳細を見る
A wavelength-scanning method is proposed to enable surface plasmon microscopes (SPMs) to determine the vertical position of a film. Currently, it is not possible for SPMs to spatially resolve the vertical position of a layer in a multilayered sample structure because the measured value is the effective refractive index (a weighted average of the different refractive indices over the entire sensing volume). We theoretically demonstrate that the vertical position of a layer can be estimated by exploiting the fact that the sensitivity of the effective refractive index depends on the distance from the substrate surface and the wavelength.
- 2012-11-25
著者
-
Matsuura Koji
Research Core For Interdiciplinary Sciences Okayama University
-
Matsuura Koji
Research Core for Interdisciplinary Sciences, Okayama University, Okayama 700-8530, Japan
-
Watanabe Koyo
Research Core for Interdisciplinary Sciences, Okayama University, Okayama 700-8530, Japan
関連論文
- 1TA5-06 マイクロ流体中の運動精子における細胞内カルシウムイオンが果たす一役割(細胞生物的課題(接着,運動,骨格,伝達,膜),第47回日本生物物理学会年会)
- Hydrophobic Silicone Elastomer Chamber for Recording Trajectories of Motile Porcine Sperms without Adsorption
- In-vitro Culture with a Tilting Device in Chemically Defined Media During Meiotic Maturation and Early Development Improves the Quality of Blastocysts Derived from In-vitro Matured and Fertilized Porcine Oocytes
- Wavelength-Scanning Method for Identifying Vertical Position of Film Using Surface Plasmon Microscopes
- 1PT211 マウス胚盤胞における細胞内カルシウム濃度とメカニカルストレス負荷の同時計測(日本生物物理学会第50回年会(2012年度))