Effect of Internal Electric Field in Well Layer of InGaN/GaN Multiple Quantum Well Light-Emitting Diodes on Efficiency Droop
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概要
- 論文の詳細を見る
We investigate the effect of internal electric field in InGaN well layer of InGaN/GaN multiple quantum well light-emitting diodes (LEDs) on efficiency droop behavior. The simulation results show that the internal electric field in InGaN well layers of Ga-polar LEDs is same as the direction of external electric field by forward bias voltage, resulting in a strong efficiency droop. However, N-polar LEDs show that the efficiency droop is drastically improved due to an increase of internal quantum efficiency and carrier injection efficiency by weakening the internal electric field with increasing the forward bias voltage and decrease of electron overflow.
- 2012-10-25
著者
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KIM Young
Samsung Advanced Institute of Technology
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Park Seong-Ju
School of Materials Science and Engineering, Gwangju Institute of Science and Technology, Gwangju 500-712, Korea
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Park Seong-Ju
School of Materials Science and Engineering, Gwangju Institute of Science and Technology, Gwangju 500-712, Republic of Korea
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Lee Dong-Yul
Samsung Electronics Co., Ltd., Yongin, Gyeonggi 446-711, Republic of Korea
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Han Sang-Heon
School of Materials Science and Engineering, Gwangju Institute of Science and Technology, Gwangju 500-712, Republic of Korea
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Lim Jin-Young
Samsung Electronics Co., Ltd., Yongin, Gyeonggi 446-711, Republic of Korea
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Lee Jeong
Samsung Electronics Co., Ltd., Yongin, Gyeonggi 446-711, Republic of Korea
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Kim Dong-Joon
Samsung Electronics Co., Ltd., Yongin, Gyeonggi 446-711, Republic of Korea
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Kim Sung-Tae
Samsung Electronics Co., Ltd., Yongin, Gyeonggi 446-711, Republic of Korea
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Kim Young
Samsung Electronics Co., Ltd., Yongin, Gyeonggi 446-711, Republic of Korea
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Kim Sung-Tae
Samsung Electronics Co., Ltd., Suwon, Gyeonggi 443-742, Republic of Korea
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PARK Seong-Ju
School of Materials Science and Engineering, Gwangju Institute of Science and Technology
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KIM Sung-Tae
Samsung Electronics Co., Ltd.
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