Consideration of Secondary Electron Emission Effect for Probe Measurement
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概要
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With increasing electron temperature (T_{\text{e}} \gtrsim 20 eV), the effect of secondary electron emission caused by electron impact becomes increasingly significant in probe measurements. Taking into consideration the secondary electron emission coefficient, a method of evaluating probe characteristics is presented and its validity was experimentally investigated using two Langmuir probes of tungsten and molybdenum electrodes with different secondary electron emission coefficients.
- 2012-09-25
著者
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Tsushima Akira
Faculty Of Engineering Yokohama National University
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YOSHIMURA Shinji
National Institute for Fusion Science
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Tsushima Akira
Faculty of Engineering, Yokohama National University, Yokohama 240-8501, Japan
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Tawaraya Takehito
Faculty of Engineering, Yokohama National University, Yokohama 240-8501, Japan
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Yoshimura Shinji
National Institute for Fusion Science, Toki, Gifu 509-5292, Japan
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