Statistical Time Lag and Electron Avalanche in Dielectric Breakdown of Mica II

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概要

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• The sizes of electron avalanches were measured by noise pulses just before the disruption on mica. Because the breakdown does not occure at the instant of the application of the transient over voltage, owing to the statistical time lag, we can count the number of the noise pulses during the interval from the instant of the application of the voltage to the instant of the disruption, which were about $10^{-2}$ sec. in our experiment. Measuring the distribution of the noise pulses at once, we have estimated the avalanche size just sufficient to cause the disruption to be $10^{8}$ electrons.

• INSTITUTE OF PURE AND APPLIED PHYSICSの論文
• 1953-11-25

著者

• Kawamura Hazimu

  Faculty Of Science And Engineering Osaka City University

• Onuki Masami

  Faculty of Science and Engineering, Osaka City University

関連論文

• The Statistical Time Lag of the Dielectric Breakdown of Mica, Glass and KCl
• A Note on the Theory of the Electron Multiplicaftion in Insulating Crystals
• On the Thickness Effect of Dielectric Breakdown of Mica and KCl
• Statistical Time Lag and Electron Avalanche in Dielectric Breakdown of Mica II
• Dielectric Breakdown of Thin Alumina Film

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