The Statistical Time Lag of the Dielectric Breakdown of Mica, Glass and KCl

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概要

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• The statistical time lag of the dielectric breakdown were measured for mica, glass and KCl, applying the recurrent pulse voltage of 2×10^<-8>〜1×10^<-7> sec width. For mica, the statistical time lag was as large as 10^<-4> sec at 10% over-voltage. On the other hand, it was at most less than 10^<-7> sec for glass and KCl at 10% over-voltage. Thus the "single avalanche mechanism" is favored for mica, since the occurrence of the extremely large avalanche which is responsible for the breakdown may rely on extreme fluctuation, and should be rare event at the threshold field. While, in the ease of KCl as well as glass, we may conclude that the "collective mechanism" is favored, from the fact that the statistical time lag is very short. From a rough estimation, we can conclude that the avalanche electrons become collective when their density becomes larger than 10^<18> l/cm^3.

• 社団法人日本物理学会の論文
• 1954-08-25

著者

• Kikuchi Takeo

  Faculty Of Science And Engineering Osaka City University

• KAWAMURA Hazimu

  Faculty of Science and Engineering, Osaka City University

• OHKURA Hiroshi

  Faculty of Science and Engineering, Osaka City University

• Ohkura Hiroshi

  Faculty Of Science And Engineering Osaka City University

• Kawamura Hazimu

  Faculty Of Science And Engineering Osaka City University

関連論文

• The Statistical Time Lag of the Dielectric Breakdown of Mica, Glass and KCl
• A Note on the Theory of the Electron Multiplicaftion in Insulating Crystals
• On the Thickness Effect of Dielectric Breakdown of Mica and KCl
• Statistical Time Lag and Electron Avalanche in Dielectric Breakdown of Mica II
• Dielectric Breakdown of Thin Alumina Film

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