Van der Pol-Type Self-Excited Microcantilever Probe for Atomic Force Microscopy
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概要
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A control method is proposed in order to reduce the steady-state amplitude of a self-excited cantilever probe in atomic force microscopy. The control method induces van der Pol oscillation by applying both linear and nonlinear feedback. Oscillation of the controlled cantilever cannot easily be stopped, even with the modulation of the viscous damping effect in the measurement environment, because the self-excited oscillation is produced far from the Hopf bifurcation point by high-gain linear feedback. Also, high-gain nonlinear feedback realizes a low steady-state amplitude to enable noncontact measurement. Finally, the feasibility of the practical application of a van der Pol-type self-excited microcantilever probe to nanoscale imaging is examined.
- 2011-07-25
著者
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Someya Takashi
University of Tsukuba, Tsukuba 305-8573, Japan
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Yabuno Hiroshi
Keio University, Yokohama 223-8522, Japan
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Kuroda Masaharu
National Institute of Advanced Industrial Science and Technology, Tsukuba, Ibaraki 305-8564, Japan
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Nishimura Kentaro
University of Tsukuba, Tsukuba 305-8573, Japan
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Hayashi Keiichi
Keio University, Yokohama 223-8522, Japan
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Ashida Kiwamu
National Institute of Advanced Industrial Science and Technology, Tsukuba, Ibaraki 305-8564, Japan
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SOMEYA Takashi
University of Occupational and Environmental Health
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KURODA Masaharu
National Institute of Advanced Industrial Science and Technology
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ASHIDA Kiwamu
National Institute of Advanced Industrial Science and Technology (AIST)
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YABUNO Hiroshi
Keio University
関連論文
- Van der Pol-Type Self-Excited Microcantilever Probe for Atomic Force Microscopy
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