Scanning Electrometer: Mapping of Electric Potential and Its Fluctuation
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概要
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We present a scanning sensor for imaging spatial distributions of electric potential and its temporal fluctuation. This technique utilizes a scanning electrometer based on a two-dimensional electron gas (2DEG) transistor in GaAs/AlGaAs. The detection mechanism is that local electric potential is detected through gate effects for the 2DEG sensor via capacitive coupling with a sample. Using this technique, we have demonstrated mapping of the electric potential distribution for another 2DEG sample in a GaAs/AlGaAs interface. In addition, by measuring local voltage fluctuations with the electrometer, we have been able to produce the first image of a noise-voltage distribution in a 2DEG sample. When this potential imaging technique is combined with terahertz-wave imaging, the resulting system works as a strong tool for investigating electron transport in the energy and space domains. As application of this system, we show separate imaging of intra- and inter-level scattering distributions in quantum Hall conductors.
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2010-08-25