Nanoscale Characterization of Microcrystalline Silicon Solar Cells by Scanning Near-Field Optical Microscopy

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概要

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• The photovoltaic mapping technique of solar cells has been developed and tested on hydrogenated microcrystalline silicon (μc-Si:H) solar cells by scanning near-field optical microscopy (SNOM). Near-field light through a fiber probe illuminates the Si layer of a solar cell and then the photovoltaic effect appears locally. Topographic and photovoltaic images were obtained using a scanning probe and defective domains with diameters of 100–200 nm appeared in the photovoltaic images. A similar inhomogeneity was observed by conductive atomic force microscopy. The photovoltaic images demonstrate that film inhomogeneities affect solar cell performance. The results indicate that a scanning near-field microscope is useful for the quality monitoring of nanoscale junctions of hydrogenated microcrystalline silicon solar cells.

• Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
• 2009-09-25

著者

• Shen Zhenhua

  Graduate School of Engineering, Gifu University, Gifu 501-1193, Japan

• Yoshida Norimitsu

  Graduate School of Engineering, Gifu University, Gifu 501-1193, Japan

• Itoh Takashi

  Graduate School of Engineering, Gifu University, Gifu 501-1193, Japan

• Gotoh Tamihiro

  Graduate School of Engineering, Gunma University, Maebashi 371-8510, Japan

• Yamamoto Yoshiki

  Graduate School of Engineering, Gifu University, Gifu 501-1193, Japan

• Ogawa Shunsuke

  Graduate School of Engineering, Gifu University, Gifu 501-1193, Japan

• Nonomura Shuichi

  Graduate School of Engineering, Gifu University, Gifu 501-1193, Japan

関連論文

• Nanoscale Characterization of Microcrystalline Silicon Solar Cells by Scanning Near-Field Optical Microscopy

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