Near-Infrared Attenuated Total Reflection Raman Spectroscopy for Polymer Surface Observation

概要

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We first constructed an apparatus for near-infrared attenuated total reflection Raman (ATR-Raman) spectroscopy and measured fluorescent polymer surfaces with near-infrared excitation. Near-infrared ATR-Raman spectra were observed without the aid of multiple reflections, resonance Raman effects, or surface-enhanced Raman effects. The usefulness of the constructed apparatus was evaluated by measuring the 130-nm-thick top layer of a layered polymer film. The incident-angle dependence of ATR-Raman intensity was analyzed based on a theory about the optical electric field at the interface between the prism and the top layer. We also observed the ATR-Raman spectra of an industrial fluorescent polymer film.
Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
2008-03-25