Development of Step-and-Scan-Type $XY$-Stage System for Electron Beam Systems
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概要
- 論文の詳細を見る
The trend towards minimization in ultralarge-scale integration (ULSI) fabrication requires an increasingly precise motion accuracy for an $XY$-stage in a high-vacuum environment of electron beam (e-beam) systems. Aerostatic bearings allow for an extremely smooth motion, because the slider of the $XY$-stage is supported by an air film under a noncontact condition. However, such an $XY$-stage in aerostatic bearings is not easily introduced into the e-beam systems because of the markedly high amount of exhaust gas leaking into a vacuum chamber. In this paper, we describe a newly developed hybrid $XY$-stage guided by aerostatic bearings equipped with a noncontact seal mechanism for scanning motion and by mechanical rolling guides for stepping motion.
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2007-09-30
著者
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Saji Nobuhito
Systemized Products Business Department, NSK Ltd., 12 Kirihara-cho, Fujisawa, Kanagawa 252-0811, Japan
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Komatsubara Ryuichi
Technology and Development Division, Tokyo Electron Ltd., 1-2-41 Machiya, Shiroyama-machi, Sagamihara, Kanagawa 220-0101, Japan
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Shinozaki Hiroyuki
Semiconductor Equipment Division, Precision Machinery Company, Ebara Corporation, 4-2-1 Honfujisawa, Fujisawa, Kanagawa 251-8502, Japan
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Nakamura Tsuyoshi
Systemized Products Business Department, NSK Ltd., 12 Kirihara-cho, Fujisawa, Kanagawa 252-0811, Japan
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Miyashita Masahiro
Systemized Products Business Department, NSK Ltd., 12 Kirihara-cho, Fujisawa, Kanagawa 252-0811, Japan
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Amada Akihisa
Systemized Products Business Department, NSK Ltd., 12 Kirihara-cho, Fujisawa, Kanagawa 252-0811, Japan
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Tsunoda Michio
Systemized Products Business Department, NSK Ltd., 12 Kirihara-cho, Fujisawa, Kanagawa 252-0811, Japan