Detection of Recording Marks on Digital Versatile Discs and Blu-ray Discs using Conductive Atomic Force Microscopy

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概要

• 論文の詳細を見る

• Recording bits on recordable phase-change discs are studied using conductive atomic force microscopy (C-AFM) at high contrast. The grain size and boundary analysis of different phase-change recording materials can be performed at nanoscale spatial resolution. This study shows that C-AFM is not only suited to image the amorphous marks written on phase-change-based rewritable digital versatile discs (DVD) or Blu-ray discs (BD), but is also capable of revealing the appearance of bits in CuSi-based write-once BD discs.

• 2007-09-15

著者

• Kuiper A.

  Philips Research Laboratories, High Tech Campus 11, 5656 AE Eindhoven, The Netherlands

• Mank Arjan

  Philips Research Laboratories, High Tech Campus 11, 5656 AE Eindhoven, The Netherlands

• Nulens Harry

  Philips Research Laboratories, High Tech Campus 11, 5656 AE Eindhoven, The Netherlands

• Feddes Bas

  Philips Research Laboratories, High Tech Campus 11, 5656 AE Eindhoven, The Netherlands

• Wei Gongming

  Philips Research East Asia, 38th Fr, Kerry Everbright City, 218 Tianmuxi Rd, Shanghai 200070, China

• Feddes Bas

  Philips Research Europe, Philips Research Hightech Campus 34, 5656 AE Eindhoven, The Netherlands

• Wei Gongming

  Philips Research East Asia, 218 Tian Mu Xi Rd, Shanghai 200070, P.R. China

関連論文

• Detection of Recording Marks on Digital Versatile Discs and Blu-ray Discs using Conductive Atomic Force Microscopy
• Analysis of the Degradation Mechanism during Repeated Overwrite of Phase-Change Discs
• High-Speed $7\times$ CuSi-Based Write-Once Blu-ray Disc
• Calibration of the Thermal Conductivity of Thin Films in Phase-Change Optical-Recording Stacks

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