Calibration of the Thermal Conductivity of Thin Films in Phase-Change Optical-Recording Stacks

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概要

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• We describe two different methods of calibrating the thermal conductivity of thin films in phase change optical recording stacks, the melt threshold method and the transmission electron microscope (TEM) picture based method. Both methods use numerical modeling to approximate the thermal conductivities of some commonly used materials in phase change recording. The aim of our study is to find a consistent set of values for the thermal conductivities, such that temperatures in different recording stacks at different velocities are correctly predicted. Both methods were found to give consistent results. The relationships between thermal conductivity, the type of interface, and the thickness of the thin film were also investigated. A good match between simulated results and experimental results was demonstrated.

• 2007-01-15

著者

• Feddes Bas

  Philips Research Europe, Philips Research Hightech Campus 34, 5656 AE Eindhoven, The Netherlands

• Wei Gongming

  Philips Research East Asia, 218 Tian Mu Xi Rd, Shanghai 200070, P.R. China

関連論文

• Detection of Recording Marks on Digital Versatile Discs and Blu-ray Discs using Conductive Atomic Force Microscopy
• Calibration of the Thermal Conductivity of Thin Films in Phase-Change Optical-Recording Stacks

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