Direct Determination of X-Band Permittivity of Dielectrics by Partial Overlay on Electromagnetically Coupled Microstrip Ring Resonator

概要

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A technique using an electromagnetically coupled microstrip ring resonator (EMC-MRR) is proposed for measuring the relative permittivity $\varepsilon_{\text{r}}$ of dielectric materials. From our experimental results, an equation is suggested to determine $\varepsilon_{\text{r}}$ by empirically modifying the standard design equation for MRR using frequency-dependent effective permittivity. The equation is simple and very general. Materials of interest (dielectric strips) with suitable size are partially overlaid on the ring resonator at ${\sim}10$ GHz and the change in resonant frequency of the system is measured to obtain $\varepsilon_{\text{r}}$ directly. Validations are performed with test dielectrics such as RT-duroid (5880) and glass epoxy. The equation is in agreement with the experimental results with an error of about $\pm 5$%.
Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
2007-06-15