Effect of Multiple Reflections on Accuracy of Electro-Optic Coefficient Measurements
スポンサーリンク
概要
- 論文の詳細を見る
The intensity of a detected beam, taking into account multiple reflections occurring on the surface of a crystal rod, for a Mach–Zehnder interferometer, a Michelson interferometer and a Senarmont polarimeter has been derived. Using the derived equations, we analyzed the effect of multiple reflections in terms of the number of reflections on the surface, the static phase, and the refractive indices as well as the reflectivity of the random uniaxial crystals. Through the simulations, to realize high accuracy measurement and obtain reliable results with a low driving voltage, the careful treatment of the electro-optic sample is necessary.
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2007-12-15
著者
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Jin Lianhua
Department Of Materials And Life Science Faculty Of Science And Technology Seikei University
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Takizawa Kuniharu
Department Of Materials And Life Science Faculty Of Science And Technology Seikei University
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Yonekura Kazuya
Department Of Materials And Life Science Faculty Of Science And Technology Seikei University
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Takizawa Kuniharu
Department of Materials and Life Science, Faculty of Science and Technology, Seikei University, 3-3-1 Kichijoji-Kitamachi, Musashino, Tokyo 180-8633, Japan
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Yonekura Kazuya
Department of Applied Physics, Faculty of Engineering, Seikei University, Musashino, Tokyo 180-8633, Japan
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Yonekura Kazuya
Department of Materials and Life Science, Faculty of Science and Technology, Seikei University, 3-3-1 Kichijoji-Kitamachi, Musashino, Tokyo 180-8633, Japan
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Jin Lianhua
Department of Materials and Life Science, Faculty of Science and Technology, Seikei University, 3-3-1 Kichijoji-Kitamachi, Musashino, Tokyo 180-8633, Japan
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Takizawa Kuniharu
Department of Material and Life Science, Faculty of Science and Technology, Seikei University, Musashino, Tokyo 180-8633, Japan
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