Ferroelectric and Luminescent Properties of Eu-Doped SrBi2Ta2O9 Films
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概要
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Sr-deficient and Bi-excess strontium bismuth tantalate (SBT) films doped with Eu atoms with concentrations from 1.25 to 5 mol % (SBT:Eu) were grown on Pt/Ti/SiO2/Si substrates by spin coating. The crystallinity of the SBT:Eu films was characterized by X-ray diffraction analysis. The ferroelectric and luminescent properties of the SBT:Eu films were measured at room temperature. Polycrystalline SBT:Eu films with the Aurivillius phase were grown, in which the Eu concentration was less than 5 mol %. The remnant polarization values of the 260-nm-thick SBT:Eu films with Eu concentrations of 1.25 and 5 mol % were approximately 4.0 and 0.86 μC/cm2, respectively. The PL intensity of the SBT:Eu films was significantly dependent on both annealing temperature and Eu concentrations. The maximum PL intensity was obtained in a 5 mol %-Eu-doped SBT film at an annealing temperature of 850 °C.
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2007-10-30
著者
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Aizawa Koji
Optoelectronic Device System Research and Development Center, Kanazawa Institute of Technology, Nonoichi, Ishikawa 921-8501, Japan
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Ohtani Yusuke
Optoelectronic Device System Research and Development Center, Kanazawa Institute of Technology, Nonoichi, Ishikawa 921-8501, Japan
関連論文
- Effect of Eu/Sr Ratios on Ferroelectric and Fluorescent Properties of Eu-Substituted Strontium Bismuth Tantalate Films
- Ferroelectric and Luminescent Properties of Eu-Doped SrBi2Ta2O9 Films