Systematic Experiment of Mott Scattering
スポンサーリンク
概要
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We studied the characteristics of Mott scattering systematically by constructing a special chamber, where target film thickness and the position of electron detectors can be controlled by an engineering workstation using stepping motors. Using this instrument, key parameters such as effective Sherman function and intensity were measured as functions of the scattered electron energy, target film thickness, and electron scattering angle. In the range of the electron energies we studied, i.e., 60–120 keV, a lower energy is preferable to achieve a large figure of merit. The results are compared with previously reported simulations.
- 2006-08-15
著者
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Kohashi Teruo
Joint Research Center For Atom Technology (jrcat)-angstrom Technology Partnership (atp)
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Koike Kazuyuki
Central Research Laboratory Hitachi Ltd.
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Konoto Makoto
Joint Research Center for Atom Technology (JRCAT), Angstrom Technology Partnership (ATP), 1-1-1 Higashi, Tsukuba, Ibaraki 305-0046, Japan
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Koike Kazuyuki
Central Research Laboratory, Hitachi Ltd., 1-280 Higashi-koigakubo, Kokubunji, Tokyo 185-8601, Japan
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Kohashi Teruo
Joint Research Center for Atom Technology (JRCAT), Angstrom Technology Partnership (ATP), 1-1-1 Higashi, Tsukuba, Ibaraki 305-0046, Japan
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