Novel Interface Properties of Au Overlayer on Top of C60 Polycrystalline Film
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概要
- 論文の詳細を見る
From a temperature dependence of the dark electrical conductivity of Au overlayer $\sigma_{\text{M}}(T)$ measured along the interface direction on top of a C60 polycrystalline film, a dramatic change in $\sigma_{\text{M}}$ is observed at $T \approx 255$ K; $\sigma_{\text{M}}(T)$ increases with increasing temperature. As deduced from $\sigma_{\text{M}}$ versus $1/T$, an activation energy of $200 \pm 30$ meV for $T<255$ K is much larger than that of $59 \pm 2$ meV for $T>255$ K. These novel phenomena are explained by structural–electronic interaction on the Au/C60 interface with a change in the properties of the induced surface states due to the rotational order/disorder phase transition.
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2006-07-15
著者
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Liao Jian-liang
Department Of Physics And Center Of Nano-technology Chung-yuan Christian University
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Chiu Kuan-cheng
Department Of Physics And Center For Nano-technology Chung-yuan Christian University
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Liao Jian-Liang
Department of Physics and Center of Nano-Technology, Chung-Yuan Christian University, Chung-Li, Taiwan 32023, R.O.C.
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Chiu Kuan-Cheng
Department of Physics and Center of Nano-Technology, Chung-Yuan Christian University, Chung-Li, Taiwan 32023, R.O.C.
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