Free Boundary Domain Wall Pinning Model for the Magnetization Reversal in Magnetic Thin Films
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概要
- 論文の詳細を見る
A free boundary domain wall pinning model for the magnetization reversal in magnetic thin films was proposed based on the experimental observations. The dependence of the switching field on the defect width, the direction of the external magnetic field, and the magnetic parameters (including magnetization, anisotropy, and exchange stiffness) of the host material and the defect was studied. In particular, the switching field, domain wall angle, and even the whole hysteresis loops of the strongly exchange-coupled NiFe/SmFe/NiFe trilayered film, which were found experimentally to depend on the direction of the external magnetic field, were well reconstructed by the free boundary domain wall pinning model using the experimental average magnetic parameters of the film.
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2006-01-15
著者
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Yan Shi-shen
School of Physics and Microelectronics, Shandong University, Jinan, Shandong, 250100, P. R. China
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Gao Ru-wei
School of Physics and Microelectronics, Shandong University, Jinan, Shandong, 250100, P. R. China
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Tian Yu-feng
School of Physics and Microelectronics, Shandong University, Jinan, Shandong, 250100, P. R. China
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Liu G.
School of Physics and Microelectronics, Shandong University, Jinan, Shandong, 250100, P. R. China
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Garmestani H.
School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, GA 30332, U.S.A.
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Hu Shu-jun
School of Physics and Microelectronics, Shandong University, Jinan, Shandong, 250100, P. R. China
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Chen Yan-xue
School of Physics and Microelectronics, Shandong University, Jinan, Shandong, 250100, P. R. China
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Mei Liang-mo
School of Physics and Microelectronics, Shandong University, Jinan, Shandong, 250100, P. R. China
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Liu G.
School of Aerospace Systems University of Cincinnati
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- Free Boundary Domain Wall Pinning Model for the Magnetization Reversal in Magnetic Thin Films