Influence of Diffusion on Properties of 173 nm Light Emission from Discharge Cells in Plasma Display Panel
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概要
- 論文の詳細を見る
A simple analytical expression $Y$ of the 173 nm emission intensity is described in terms of the diffusion loss $d_{\text{f}}$, the three-body collision $ \eta $, the gas pressure $ p$ and the xenon mole fraction $ \chi $. The emission intensity $Y$ of 173 nm photons decreases with increasing parameter $d_{\text{f}}$. Moreover, $Y$ increases rapidly with the gas pressure $ p$ and the xenon mole fraction $ \chi $. Results from the theoretical model agree markedly well with experimental data.
- 2005-09-15
著者
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Uhm Han
Department Of Molecular Science And Technology Ajou University
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Choi Eun
Pdp Research Center Department Of Electrophysics Kwangwoon University
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Jung Kyu
PDP Research Center, Department of Electrophysics, Kwangwoon University, 447-1 Wolgye-Dong, Nowon-Gu, Seoul 139-701, Korea
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