Desorption of Hydrogen from SmH3-δ Films: Effect of Palladium Overlayer Thickness
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概要
- 論文の詳細を見る
Desorption of hydrogen from palladium-capped SmH3-δ films of 55 nm thickness has been studied using optical measurements. Result show that the thickness of the palladium cap layer affects the deloading of hydrogen from the hydrided films. The direct band gap of the SmHx films, calculated from the $(\alpha\mathrm{h}\nu)^{2}$ vs $\mathrm{h}\nu$ plots, has been found to decrease with increasing thickness of the palladium overlayer, a fact attributed to the enhanced deloading of hydrogen. The removal of hydrogen from these films also leads to the formation of localized states, whose signature is clearly visible in these plots.
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2004-03-15
著者
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Kumar Pushpendra
Thin Film Laboratory Department Of Physics Indian Institute Of Technology
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Malhotra Lalit
Thin Film Laboratory, Department of Physics, Indian Institute of Technology, Hauz Khas, New Delhi 110016, India
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Malhotra Lalit
Thin Film Laboratory, Department of Physics, Indian Institute of Technology Delhi, Hauz Khas, New Delhi 110016, India
関連論文
- Influence of Palladium Overlayer on Switching Behaviour of Samarium Hydride Thin Films
- Effect of Palladium Overlayer on Samarium Hydride Thin Film Switchable Mirror: Electrochemical and Topographical Study
- Desorption of Hydrogen from SmH3-δ Films: Effect of Palladium Overlayer Thickness