Frequency-Dependent Dielectric Breakdown in Thin Polyvinylcarbazole Films
スポンサーリンク
概要
- 論文の詳細を見る
Dielectric breakdown in thin polyvinylcarbazole (PVK) films prepared by vapor deposition polymerization has been investigated at various ac voltages. Real-time measurements were carried out automatically with a system composed of a digital oscilloscope, a controllable signal generator and a microcomputer. Self-healing breakdown takes place at the peak applied voltage. AC electric strength decreases with temperature, and increases with frequency in the range of 10 Hz–3 kHz. A gold electrode has a lower electric strength than an aluminum electrode. The frequency-dependent breakdown has been explained tentatively in terms of the field enhancement due to the hole space charge leading to carrier injection and resulting in the breakdown.
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2003-08-15
著者
-
Miyairi Keiichi
Faculty Of Engineering Shinshu University
-
Miyairi Keiichi
Faculty of Engineering, Shinshu University, Wakasato 4-17-1, Nagano 380-8553, Japan
関連論文
- Frequency Dependent Dielectric Breakdown of Thin Polyimide Films Prepared by Vapor Deposition Polymerization
- Electrical properties of conducting polymer/CNT composite films prepared on thin titanium dioxide layer(Evaluation of organic materials)
- Electrical properties of conducting polymer /CNT composite films prepared on thin titanium dioxide layer
- Anomalous Dielectric Dispersion in Tantalum Oxide Films Prepared by RF Sputtering
- Frequency-Dependent Dielectric Breakdown in Thin Polyvinylcarbazole Films