Scanning Near-Field Optical Microscope Study of Ag Nanoprotrusions Fabricated by Nano-oxidation with Atomic Force Microscope
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概要
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We investigate light transmission of Ag nano protrusions with a scanning near-field optical microscope (SNOM) to study the surface plasmon (SP) in metallic films. A Ag nanoprotrusion whose height is ${\sim}20$ nm is fabricated by the deposition of Ag on the Ti nano-protrusion template which is made by nano-oxidation with an atomic force microscope (AFM). It is found that through several scans, the tip is coated with Ag from the sample, and this modified tip shows apparent undulation patterns in SNOM imaging, while a fresh tip does not. The undulation pattern in the SNOM image is observed only along the direction of polarization light close to the expected undulation period. This result indicates that local launching of SP is effective with an Ag-coated tip and the SP launching characteristic is consistent with the so-called $\cos^{2}\Phi$ SP distribution. By finite domain time difference (FDTD) simulations, it is confirmed that light transmission is enhanced in the Ag-coated tip compared to the fresh tip. Our results imply that local illumination with a noble-metal-coated cantilever probe tip is desirable for obtaining more detailed features in SNOM images involved with SP. Our results also indicate that a nano protrusion fabricated by AFM-based nano-oxidation can be applied to an optical element using surface plasmon.
- 2003-12-15
著者
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Park K.-h.
Basic Research Laboratory Electronics And Telecommunications Research Institute
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Kim Junho
Basic Research Laboratory Electronics And Telecommunications Research Institute
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Kim E.-k.
Basic Research Laboratory Electronics And Telecommunications Research Institute
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Kim Jeongyong
Department Of Physics University Of Incheon
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Kim Jeongyong
Department of Physics, University of Incheon, Dowha-dong 177, Nam-ku, Incheon 402-749, Korea
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Kim E.-K.
Basic Research Laboratory, Electronics and Telecommunications Research Institute, Gajeong-dong 161, Yuseong, Daejeon 305-350, Korea
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Song K.-B.
Basic Research Laboratory, Electronics and Telecommunications Research Institute, Gajeong-dong 161, Yuseong, Daejeon 305-350, Korea
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Lee S.-Q.
Basic Research Laboratory, Electronics and Telecommunications Research Institute, Gajeong-dong 161, Yuseong, Daejeon 305-350, Korea
関連論文
- Standardization of Excitation Efficiency in Near-field Scanning Optical Microscopy
- Scanning Near-Field Optical Microscope Study of Ag Nanoprotrusions Fabricated by Nano-oxidation with Atomic Force Microscope
- Raman Study of Polymer–Metal Hybrid Nanotubes Using Atomic Force/Confocal Combined Microscope
- Fabrication of a High-Throughput Cantilever-Style Aperture Tip by the Use of the Bird's-Beak Effect
- Fabrication of Cantilevered Tip-on-Aperture Probe for Enhancing Resolution of Scanning Near-Field Optical Microscopy System