Emission Microscope Observation of Metal–Insulator–Metal Emitters
スポンサーリンク
概要
- 論文の詳細を見る
Metal-insulator-metal emitters with an aluminum oxide insulating layer were investigated by making use of emission microscopy to observe the distribution and the fluctuation of electron emission. The microscope image showed a spotty pattern, indicating that the electrons were emitted from many separate sites on the surface. The density of spots reached $10^{7}$ cm-2 under the driving voltage of 8.5 V. It was found that two types of emission sites having different power spectra of the fluctuation were randomly distributed on the surface. The different power spectra could be attributed to the formed and nonformed states of the emission sites.
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2003-12-15
著者
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Kawate Shinichi
Display Development Headquarters Canon Inc.
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Kusaka Takao
Canon Research Center, CANON Inc., 5-1 Morinosato-Wakamiya, Atsugi, Kanagawa 243-0193, Japan
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Ohtsuka Mitsuru
Canon Research Center, CANON Inc., 5-1 Morinosato-Wakamiya, Atsugi, Kanagawa 243-0193, Japan
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Yamanobe Masato
Corporate Strategy & Development Headquarters, CANON Inc., Shimomaruko, Ohta-ku, Tokyo 146-8501, Japan
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Kawate Shinichi
Display Development Headquarters, CANON Inc., 6770 Tamura, Hiratsuka, Kanagawa 254-0013, Japan
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Yamanobe Masato
Corporate Strategy & Development Headquarters, CANON Inc., Shimomaruko, Ohta-ku, Tokyo 146-8501, Japan