In-Situ Electrical Study of a Reversible Surface Modification and a Nanomachining of Gold Microstrips by the Voltage-Biased Atomic Force Microscope Tip in Air
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概要
- 論文の詳細を見る
We report on a reversible polymerization of ambient carbonaceous deposits on the surface of gold microstrips by means of a voltage-biased atomic force microscope tip in air. This approach is found capable of controlled writing, erasing, and rewriting of carbon-rich deposits with sizes in nanometer regime. Physical mechanism for this reversible patterning is proposed to be the current-induced electrochemical process. In addition, we introduce a novel nanomachining technique based on an electric field enhanced cutting process.
- INSTITUTE OF PURE AND APPLIED PHYSICSの論文
- 2001-06-30
著者
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Kim Byong
Material And Device Laboratory Samsung Advanced Institute Of Technology
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Ryu Won
Material And Device Laboratory Samsung Advanced Institute Of Technology
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Lee Nae
Material And Device Laboratory Samsung Advanced Institute Of Technology
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Sok Jung
Material And Device Laboratory Samsung Advanced Institute Of Technology
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Min Yo-sep
Material And Device Laboratory Samsung Advanced Institute Of Technology
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Chae Soo
Material And Device Laboratory Samsung Advanced Institute Of Technology
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Chae Hee
Material And Device Laboratory Samsung Advanced Institute Of Technology
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Kim Moon
Material And Device Laboratory Samsung Advanced Institute Of Technology
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Lee Nae
Material and Device Laboratory, Samsung Advanced Institute of Technology, San #14, Nongseo-Ri, Kiheung-Eup, Yongin-City, Kyungki-Do 449-900 Korea
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Kim Byong
Material and Device Laboratory, Samsung Advanced Institute of Technology, San #14, Nongseo-Ri, Kiheung-Eup, Yongin-City, Kyungki-Do 449-900 Korea
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Kim Moon
Material and Device Laboratory, Samsung Advanced Institute of Technology, San #14, Nongseo-Ri, Kiheung-Eup, Yongin-City, Kyungki-Do 449-900 Korea
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Chae Hee
Material and Device Laboratory, Samsung Advanced Institute of Technology, San #14, Nongseo-Ri, Kiheung-Eup, Yongin-City, Kyungki-Do 449-900 Korea
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Chae Soo
Material and Device Laboratory, Samsung Advanced Institute of Technology, San #14, Nongseo-Ri, Kiheung-Eup, Yongin-City, Kyungki-Do 449-900 Korea
関連論文
- In-Situ Electrical Study of a Reversible Surface Modification and a Nanomachining of Gold Microstrips by the Voltage-Biased Atomic Force Microscope Tip in Air
- In-Situ Electrical Study of a Reversible Surface Modification and a Nanomachining of Gold Microstrips by the Voltage-Biased Atomic Force Microscope Tip in Air