In-Situ Electrical Study of a Reversible Surface Modification and a Nanomachining of Gold Microstrips by the Voltage-Biased Atomic Force Microscope Tip in Air
スポンサーリンク
概要
- 論文の詳細を見る
- Publication Office, Japanese Journal of Applied Physics, Faculty of Science, University of Tokyoの論文
- 2001-06-01
著者
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Kim Byong
Material And Device Laboratory Samsung Advanced Institute Of Technology
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Ryu Won
Material And Device Laboratory Samsung Advanced Institute Of Technology
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Lee Nae
Material And Device Laboratory Samsung Advanced Institute Of Technology
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MIN Yo-Sep
Material and Device Laboratory, Samsung Advanced Institute of Technology
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SOK Jung
Material and Device Laboratory, Samsung Advanced Institute of Technology
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KIM Moon
Material and Device Laboratory, Samsung Advanced Institute of Technology
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CHAE Soo
Material and Device Laboratory, Samsung Advanced Institute of Technology
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CHAE Hee
Material and Device Laboratory, Samsung Advanced Institute of Technology
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Sok Jung
Material And Device Laboratory Samsung Advanced Institute Of Technology
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Min Yo-sep
Material And Device Laboratory Samsung Advanced Institute Of Technology
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Chae Soo
Material And Device Laboratory Samsung Advanced Institute Of Technology
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Chae Hee
Material And Device Laboratory Samsung Advanced Institute Of Technology
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Kim Moon
Material And Device Laboratory Samsung Advanced Institute Of Technology
関連論文
- In-Situ Electrical Study of a Reversible Surface Modification and a Nanomachining of Gold Microstrips by the Voltage-Biased Atomic Force Microscope Tip in Air
- In-Situ Electrical Study of a Reversible Surface Modification and a Nanomachining of Gold Microstrips by the Voltage-Biased Atomic Force Microscope Tip in Air