A New Characterization Method of Photocatalytic Activity in Semiconductor Photocatalysts
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概要
- 論文の詳細を見る
We propose a new simple method for characterizing photocatalytic activity by measuring photo-generated transient charge separation at the surface of semiconductor photocatalysts. In this method, the charge separation generated by a pulse dye laser is obtained as a function of the incident laser energy. Using this method, the photocatalytic activity and the type of surface reaction (reduction or oxidation) in titanium dioxide films were rapidly determined.
- INSTITUTE OF PURE AND APPLIED PHYSICSの論文
- 2001-06-15
著者
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Yamaki Tetsuya
Department Of Epizootiology Faculty Of Veterinary Medicine Hokkaido University
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Yamamoto Shunya
Department Of Materials Development Japan Atomic Energy Research Institute
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MIYASHITA Atsumi
Department of Materials Development, Japan Atomic Energy Research Institute
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Sumita Taishi
Department Of Materials Development Japan Atomic Energy Research Institute
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Miyashita Atsumi
Department of Materials Development, Japan Atomic Energy Research Institute, Watanuki 1233, Takasaki, Gunma 370-1292, Japan
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Yamamoto Shunya
Department of Materials Development, Japan Atomic Energy Research Institute, Watanuki 1233, Takasaki, Gunma 370-1292, Japan
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Sumita Taishi
Department of Materials Development, Japan Atomic Energy Research Institute, Watanuki 1233, Takasaki, Gunma 370-1292, Japan
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