Crystallization of Ag–In–Sb–Te Phase-Change Optical Recording Films
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概要
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Crystalline phases formed on thermally annealed and laser-annealed Ag12.4In3.8Sb55.2Te28.6 four-element alloy films were observed to be different. After 1 h isothermal annealing at temperatures between 190°C and 450°C, hexagonal Sb and chalcopyrite AgInTe2 phases were observed, whereas laser annealing by initialization at laser power higher than 2.86 mW/$\mu$m2 yielded cubic crystalline Sb and AgSbTe2 phases. There was only one exothermic peak at 170°C determined by differential scanning calorimetry (DSC) measurement. Only the hexagonal Sb phase was observed by X-ray diffraction of samples subjected to DSC measurement. These experimental results suggest that the activation energy for crystallization derived from Kissinger's equation using DSC data may not be the same as that for crystallization during erasing of phase-change optical recording disks.
- INSTITUTE OF PURE AND APPLIED PHYSICSの論文
- 2001-05-15
著者
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WANG Shiunn-Yeong
Lead Data Inc.
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Chai Yeong-Cherng
Deptartment of Materials Science and Engineering, National Tsing Hua University, Hsinchu, Taiwan 300, R.O.C.
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Chang Yem-Yeu
Deptartment of Materials Science and Engineering, National Tsing Hua University, Hsinchu, Taiwan 300, R.O.C.
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Chou Lih-Hsin
Deptartment of Materials Science and Engineering, National Tsing Hua University, Hsinchu, Taiwan 300, R.O.C.
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Wang Shiunn-Yeong
Lead Data Inc., Fu Kou Hsiang, Hsinchu, Taiwan 303, R.O.C.
関連論文
- Phases of the Initialized AgInSbTe Phase Change Optical Recording Films : Optics and Quantum Electronics
- Crystallization of Ag–In–Sb–Te Phase-Change Optical Recording Films