On the Electron Photoionization Cross-Section of EL2 in GaAs
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概要
- 論文の詳細を見る
From an analysis of literature data as well as our own measurements it is shown that the recently published electron photoionization cross-section $\sigma_{n}^{0}$($\lambda$, $T$) of the EL2-as determined by photocapacitance techniques-includes major contributions of the intracentre transition cross-section $\sigma_{n}^{*}$($\lambda$, $T$). So the $\sigma_{n}^{0}$($\lambda$, $T$) as determined by photocapacitance measurements is essentially identical to the $\sigma_{n}$($\lambda$, $T$) observed in optical absorption experiments and can be used in the analysis of the latter.
- INSTITUTE OF PURE AND APPLIED PHYSICSの論文
- 1989-06-20
著者
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Winnacker A.
Siemens Corporate Research and Development Laboratories, Paul-Gossen-Strasse 100, D-8520 Erlangen, West Germany
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Winnacker A.
Siemens Corporate Research and Development Laboratories, Paul-Gossen-Str. 100, D-8520 Erlangen, West Germany
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Zach F.
Siemens Corporate Research and Development Laboratories, Paul-Gossen-Str. 100, D-8520 Erlangen, West Germany
関連論文
- Optical Mapping of the Total EL2-Concentration in Semi-Insulating GaAs-Wafers
- On the Electron Photoionization Cross-Section of EL2 in GaAs