Analysis of Carrier Traps in Continuously Operated 4,4$'$-bis[N-(1-naphthyl)-N-phenyl-amino]biphenyl/tris(8-hydroxyquinoline)aluminum-Based Organic Light-Emitting Diodes by Thermally Stimulated Current Measurement

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概要

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• We measured the reliability of two different organic light-emitting diodes (OLEDs) composed of indium tin oxide (ITO)/4,4$'$-bis[N-(1-naphthyl)-N-phenyl-amino]biphenyl ($\alpha$-NPD)/tris(8-hydroxyquinoline)aluminum (Alq3)/MgAg (two layer) or ITO/$\alpha$-NPD/$\alpha$-NPD:Alq3 (mixed layer)/Alq3/MgAg. Changes in the carrier trap distribution were estimated by thermally stimulated current (TSC) measurements. Improved device reliability was observed in the mixed-layer device. In the case of the two-layer device, the TSC peaks gradually changed depending on the duration of continuous operation, while the mixed device showed no change in its TSC spectra. These spectral differences indicate that the mixing of $\alpha$-NPD and Alq3 occurs during the continuous operation in the two-layer device.

• 2007-07-25

著者

• Adachi Chihaya

  Center For Future Chemistry Kyushu University

• Minagawa Masahiro

  Department Of Dermatology Niigata University School Of Medicine

• Sasabe Hiroyuki

  Department Of Drug Metabolism Tokushima Research Institute Otsuka Pharmaceutical Co. Ltd.

• Oyamada Takahito

  Department Of Photonics Materials Science Chitose Institute Of Science And Technology (cist)

• Adachi Chihaya

  Center for Future Chemistry, Kyushu University, 744 Motooka, Nishi, Fukuoka 819-0395, Japan

• Tadokoro Toyoyasu

  Department of Organic Light-Emitting Diodes (OLED) Development, Nippon Seiki Co., 2-2-34 Higashi-Zaoh, Nagaoka, Niigata 940-8580, Japan

• Nakahara Makoto

  Department of Photonics Materials Science, Chitose Institute of Science and Technology (CIST), 758-65 Bibi, Chitose, Hokkaido 066-8655, Japan

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