Tuning Flux-pinning in Epitaxial NdBa2Cu3O7-\delta Films via Engineered, Hybrid Nanoscale Defect Structures
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概要
- 論文の詳細を見る
Epitaxial NdBa2Cu3O7-\delta films with a hybrid nanoscale defect structure comprised of BaZrO3 nanodot arrays aligned along the $c$-axis in one half of the film thickness and aligned perpendicular to the $c$-axis in the other half thickness of the film were fabricated. Transmission electron microscopy images confirm the orientation of the nanoscale defect structures. The angular dependence of critical current density, $J_{\text{c}}$, at 77 K, 1 T, shows significantly reduced angular variation of $J_{\text{c}}$. This study nicely demonstrates how pinning characteristics can be tuned by tuning the nanoscale defect structures within the films.
- Japan Society of Applied Physicsの論文
- 2008-11-25
著者
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Goyal Amit
Materials Science And Technology Division Oak Ridge National Laboratory
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Wee Sung
Materials Science And Technology Division Oak Ridge National Laboratory
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Zuev Yuri
Materials Science And Technology Division Oak Ridge National Laboratory
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Cantoni Claudia
Materials Science And Technology Division Oak Ridge National Laboratory
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Wee Sung
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831, U.S.A.
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Cantoni Claudia
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831, U.S.A.
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Goyal Amit
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831, U.S.A.
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- Tuning Flux-pinning in Epitaxial NdBa2Cu3O7-\delta Films via Engineered, Hybrid Nanoscale Defect Structures