Field Slack Assessment for Predictive Fault Avoidance on Coarse-Grained Reconfigurable Devices

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概要

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• This paper proposes a procedure for avoiding delay faults in field with slack assessment during standby time. The proposed procedure performs path delay testing and checks if the slack is larger than a threshold value using selectable delay embedded in basic elements (BE). If the slack is smaller than the threshold, a pair of BEs to be replaced, which maximizes the path slack, is identified. Experimental results with two application circuits mapped on a coarse-grained architecture show that for aging-induced delay degradation a small threshold slack, which is less than 1ps in a test case, is enough to ensure the delay fault prediction.

著者

• Mitsuyama Yukio

  JST, CREST

• KONOURA Hiroaki

  JST, CREST and the Department of Information Systems Engineering, Osaka University

• ALNAJJAR Dawood

  JST, CREST and the Department of Information Systems Engineering, Osaka University

• ONOYE Takao

  JST, CREST and the Department of Information Systems Engineering, Osaka University

• KAMEDA Toshihiro

  JST, CREST and the Department of Information Systems Engineering, Osaka University

• HASHIMOTO Masanori

  JST, CREST and the Department of Information Systems Engineering, Osaka University

関連論文

• Field Slack Assessment for Predictive Fault Avoidance on Coarse-Grained Reconfigurable Devices
• PVT-induced timing error detection through replica circuits and time redundancy in reconfigurable devices

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