Evaluation of Edge Electron Temperature Fluctuation by the Use of Fast Voltage Scanning Method on TST-2
スポンサーリンク
概要
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Edge electron temperature fluctuation is evaluated by the use of fast voltage sweeping technique on TST-2. The validity of obtained current-voltage characteristic curve was checked by comparing the time evolutions of floating potential between that obtained from the fast voltage sweeping technique and that measured with floating probe method. Good agreement between them was confirmed. We also found that fitting errors in the evaluation of the electron temperature itself are less than 10% of fluctuation levels of the electron temperature. Therefore the accuracy of the technique is applicable to study of plasma fluctuations.
著者
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NAGASHIMA Yoshihiko
The University of Tokyo, Tokyo 113-0033, Japan
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YAMAGUCHI Takashi
The University of Tokyo, Tokyo 113-0033, Japan
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OOSAKO Takuya
CEA, IRFM, F-13108 Saint-Paul-lez-Durance, France
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Wakatsuki Takuma
The University Of Tokyo
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AMBO Takanori
The University of Tokyo
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SHINO Ryota
The University of Tokyo
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SONEHARA Masateru
The University of Tokyo
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Watanabe Osamu
The University Of Tokyo
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Ejiri Akira
The University Of Tokyo
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Kakuda Hidetoshi
The University Of Tokyo
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Hiratsuka Junichi
The University Of Tokyo
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Sakamoto Takuya
The University Of Tokyo
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Takase Yuichi
The University of Tokyo
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KOBAYASHI Hiroaki
The University of Tokyo, Chiba 277-8561, Japan
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EJIRI Akira
The University of Tokyo, Chiba 277-8561, Japan
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HANASHIMA Kentaro
The University of Tokyo, Chiba 277-8561, Japan
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INAGAKI Shigeru
Kyushu University, Kasuga 816-8580, Japan
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TAKASE Yuichi
The University of Tokyo, Chiba 277-8561, Japan
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NAGASHIMA Yoshihiko
The University of Tokyo, Chiba 277-8561, Japan
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OOSAKO Takuya
CEA, Saint Paul Lez Durance 13108, France
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HIRATSUKA Junichi
The University of Tokyo, Chiba 277-8561, Japan
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SAKAMOTO Takuya
The University of Tokyo, Chiba 277-8561, Japan
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SONEHARA Masateru
The University of Tokyo, Chiba 277-8561, Japan
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