OOSAKO Takuya | CEA, IRFM, F-13108 Saint-Paul-lez-Durance, France
スポンサーリンク
概要
関連著者
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OOSAKO Takuya
CEA, IRFM, F-13108 Saint-Paul-lez-Durance, France
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NAGASHIMA Yoshihiko
The University of Tokyo, Tokyo 113-0033, Japan
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YAMAGUCHI Takashi
The University of Tokyo, Tokyo 113-0033, Japan
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Takase Yuichi
Graduate School Of Frontier Sciences The University Of Tokyo
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Takase Yuichi
Graduate School Of Frontier Sciences The Univ. Of Tokyo
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Nagashima Yoshihiko
Graduate School Of Frontier Sciences The Univ. Of Tokyo
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Ejiri Akira
Graduate School Of Frontier Sciences The University Of Tokyo
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Ejiri Akira
Graduate School Of Frontier Science University Of Tokyo
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Sakamoto Takuya
Graduate School Of Infomatics Kyoto University
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INAGAKI Shigeru
Research Institute for Applied Mechanics, Kyushu University
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OZAKI Junichi
Faculty of Science, The University of Tokyo, Tokyo 113-0033, Japan
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SONEHARA Masateru
Faculty of Science, The University of Tokyo, Tokyo 113-0033, Japan
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YAMADA Kotaro
Graduate School of Frontier Sciences, The University of Tokyo, Kashiwa 277-8561, Japan
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KAKUDA Hidetoshi
Graduate School of Science, The University of Tokyo, Tokyo 113-0033, Japan
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AN Byung
Graduate School of Science, The University of Tokyo, Tokyo 113-0033, Japan
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HAYASHI Hiroyuki
Graduate School of Frontier Sciences, The University of Tokyo, Kashiwa 277-8561, Japan
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HANASHIMA Kentaro
Graduate School of Frontier Sciences, The University of Tokyo, Kashiwa 277-8561, Japan
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HIRATSUKA Junichi
Graduate School of Science, The University of Tokyo, Tokyo 113-0033, Japan
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KOBAYASHI Hiroaki
Graduate School of Frontier Sciences, The University of Tokyo, Kashiwa 277-8561, Japan
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KURASHINA Hiroki
Graduate School of Frontier Sciences, The University of Tokyo, Kashiwa 277-8561, Japan
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YAMAGUCHI Takashi
Graduate School of Frontier Sciences, The University of Tokyo, Kashiwa 277-8561, Japan
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WATANABE Osamu
Graduate School of Frontier Sciences, The University of Tokyo, Kashiwa 277-8561, Japan
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WAKATSUKI Takuma
Graduate School of Science, The University of Tokyo, Tokyo 113-0033, Japan
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Inagaki Shigeru
Research Institute For Applied Mechanics Kyushu University
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Hayashi Hiroyuki
Graduate School Of Engineering Osaka Institute Of Technology
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Yamaguchi Takashi
Graduate School Of Engineering Dept. Of Metallurgy University Of Tokyo
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Kobayashi Hiroaki
Graduate School Of Bioagricultural Sciences Nagoya University
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Watanabe Osamu
Graduate School Of Engineering Tokyo Metropolitan University
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Wakatsuki Takuma
The University Of Tokyo
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AMBO Takanori
The University of Tokyo
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SHINO Ryota
The University of Tokyo
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SONEHARA Masateru
The University of Tokyo
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Watanabe Osamu
The University Of Tokyo
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Ejiri Akira
The University Of Tokyo
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Kakuda Hidetoshi
The University Of Tokyo
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Hiratsuka Junichi
The University Of Tokyo
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Sakamoto Takuya
The University Of Tokyo
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Takase Yuichi
The University of Tokyo
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Yamada Kotaro
Graduate School of Advanced Science of Matter, Hiroshima University
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KOBAYASHI Hiroaki
The University of Tokyo, Chiba 277-8561, Japan
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EJIRI Akira
The University of Tokyo, Chiba 277-8561, Japan
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HANASHIMA Kentaro
The University of Tokyo, Chiba 277-8561, Japan
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INAGAKI Shigeru
Kyushu University, Kasuga 816-8580, Japan
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TAKASE Yuichi
The University of Tokyo, Chiba 277-8561, Japan
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WAKATSUKI Takuma
Graduate School of Science, The University of Tokyo, Bunkyo 113-0033, Japan
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NAGASHIMA Yoshihiko
The University of Tokyo, Chiba 277-8561, Japan
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OOSAKO Takuya
CEA, Saint Paul Lez Durance 13108, France
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HIRATSUKA Junichi
Graduate School of Science, The University of Tokyo
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HIRATSUKA Junichi
The University of Tokyo, Chiba 277-8561, Japan
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SAKAMOTO Takuya
The University of Tokyo, Chiba 277-8561, Japan
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TAKASE Yuichi
Graduate School of Frontier Science, University Tokyo, Kashiwa 277-8561, Japan
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SONEHARA Masateru
The University of Tokyo, Chiba 277-8561, Japan
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NAGASHIMA Yoshihiko
Graduate School of Frontier Science, The University of Tokyo, Kashiwa 277-8561, Japan
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HIRATSUKA Junichi
Graduate School of Frontier Sciences, The University of Tokyo, Kashiwa 277-8561, Japan
著作論文
- Evaluation of Edge Electron Temperature Fluctuations Using a Conditional Technique on TST-2
- Evaluation of Edge Electron Temperature Fluctuation by the Use of Fast Voltage Scanning Method on TST-2