磁場走査時の定量測定条件

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The necessary conditions for the good quantitative analysis of mass spectra obtained for a mass spectrometer of the Mattauch-Herzog type are derived theoretically and confirmed experimentally. The operational condition of the mass spectrometer is most conveniently expressed by using the peak frequency νp which is defined as the reciprocal of the time duration elapsed by the passage of one peak. Normally νp is given by the following equation:νp=K/ [ (Sc+G?SM)M<SUP>1/2</SUP>τ ], where Sc and SM are the widths of the collector and the main slit respectively, G the magnification of the image, M the molecular weight of the ion, τthe scan time and K a constant. The constant K can be determined experimentally for a given apparatus. The wellknown flat top conditions, which are necessary for the good quantitative mass spectrometry, can be related to this peak frequency νp. In the case of the mass spectrometer of the Mattauch-Herzog type used in the experiment, the flat top peak appears when2.5 SM≤ Sc andν≥2νp, whereνis the response frequency of the electrical recording system. Since the resolving power R of the mass spectrometer is determined by the slit widths, the relationship betweenνand Rf(the flat-top resolving power)can also be obtained from the above conditions. These treatments are useful especially for rapid magnetic scanning. An example of the conditions for the quantitative mass spectrometry obtained from the above theory is as follows;SM=15μm, Sc=40μm, Rf=2700, ν≥1.6kHz(by a visigraph recorder), τ5 sec(m/e 14 to 50). The experiments show that the accuracy of the quantitative analysis of gas components is tolerable under the above conditions, but the accuracy decreases very rapidly ifνor τdoes not satisfy these conditions.
日本質量分析学会の論文

磁場走査時の定量測定条件

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