Dielectric Properties of Poly(methylphenylsilylene) under Humidity in the Kilohertz Range.
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概要
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The capacitance and dielectric loss tangent of poly(methylphenylsilylene) thin films were measured under various humidities over the frequency range 0.1–1000 kHz. In the high-humidity range, both the quantities increase with decreasing frequency. The existence of an anomalously low-frequency relaxation (lower than 0.1 kHz) is suggested in which the adsorbed water molecules are involved.
- 公益社団法人 日本化学会の論文
著者
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Ohigashi Hiroji
Department of Material Science and Engineering, Yamagata University, Yonezawa 992-8510, Japan
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Ohigashi Hiroji
Department of Materials Science and Engineering, Yamagata University
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Iwai Takayoshi
Consumer Products Engineering Laboratory, Toshiba Corporation
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Awano Hiroshi
Department of Applied Chemistry, Faculty of Engineering, Osaka City University
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Awano Hiroshi
Department of Materials Science and Engineering, Yamagata University
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