Detection of Single Atom Extraction and Deposition Events during Nanolithographic Processing of Silicon with a Scanning Tunneling Microscope.
スポンサーリンク
概要
- 論文の詳細を見る
By monitoring the vertical motion of the tip of a scanning tunneling microscope (STM) during atomic manipulation on a surface, we have been able to detect for the first timeÅngstrom-scale displacements of the tip which are associated with the extraction and deposition of atoms on the surface, due to voltage pulses applied to the sample. The temporal distribution of these tip displacements during and after the application of the voltage pulse yields important information about the nature of the modification process.
- 日本学士院の論文
著者
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Grey Francois
Aono Atomcraft Project Erato Jrdc:mikroelectronik Centret Dtu
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Kobayashi Ataru
Aono Atomcraft Project Research Development Corporation Of Japan (jrdc)
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Uchida Hironaga
Aono Atomcraft Project Research Development Corporation Of Japan (jrdc)
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Aono Masakazu
Aono Atomcarft Project Jrdc
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AONO Masakazu
Aono Atomcraft Project
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HUANG DE
Aono Atomcraft Project
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SNYDER Eric
Aono Atomcraft Project
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KOBAYASHI Ataru
Aono Atomcraft Project
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GREY Francois
Aono Atomcraft Project
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