表面・界面の新しい評価法 (結晶工学<特集>)
スポンサーリンク
概要
- 論文の詳細を見る
Several Methods recently developed for characterization of solid surfaces and solid-solid interfaces, mainly ion scattering techniques, are described. Channeling techniques utilizing high energy (-MeV) ions and channeling-blocking effects for medium energy (-0.1 MeV) ions have successfully been applied to structure analysis with small (-0.1-1Å) displacements of crystal atoms near surfaces and interfaces. Basic principles of those methods are explained, including computer simulations of particle trajectries. Low energy (-keV) ion scattering and scanning tunneling microscopy are shown to be fruitful techniques for surface characterization. A non-destructive method for interface analysis using energy dependent escape depths of keV electrons is also briefly mentioned. (J. Cryst. Soc. Jpn. <B>28</B>, <I>160</I> (1986) ) .
- 日本結晶学会の論文