Demonstration of 10 keV-width K-edge Imaging Using an Energy-Discrimination X-ray Computed Tomography System Utilizing a Silicon-PIN Detector

概要

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A high-energy-resolution X-ray Computed Tomography(CT)system is of a first-generation type and consists of an X-ray generator, a turntable, a translation stage, a two-stage controller, a silicon-PIN detector system with amplifiers, a multichannel analyzer(MCA), a counter card(CC), and a personal computer(PC). CT is accomplished by repeating the translation and the rotation of an object, and projection curves of the object are obtained by the linear scanning by moving the object. Both photon-energy level and energy width are determined by the MCA, and the pulses of the discriminated event signal from the MCA are counted by CC in conjunction with PC. The maximum count rate was approximately 5 kcps, and energy-discrimination CT was carried out with a photon-energy resolution of 0.15 keV. To perform iodine K-edge CT, X-ray photons with an energy range from 33.2 to 43.2 keV were used. Next, to carry out cerium K-edge CT, an energy range from 40.3 to 50.3 keV was selected. Using K-edge CT, iodine and cerium molecules were observed at high contrast. Therefore, molecular-level imaging for cancer diagnosis might be accomplished.